William S. Rees, Jr., Oliver Just and Donald S. Van Derveer
Two cerium compounds, Ce{N[Si(CH3)3]2}3 and Ce(tmhd)4 (tmhd=2,2,6,6-tetramethylheptane-3,5-dionate), have been evaluated for utilization in the preparation of thin films of SrS:Ce by atomic layer epitaxy (ALE). The resultant coatings have been characterized for use in electroluminescent (EL) devices. The observed emission maximum at 518 nm for the devices derived from Ce(tmhd)4 shifts to 480 nm for those resulting from Ce{N[Si(CH3)3]2}3. This shift may be correlated with the basicity of the ligand present on the dopant element.