Correction for volatility differences between organic sample analytes and standards in organic solutions analyzed by inductively coupled plasma-atomic emission and mass spectrometry

Abstract

A novel technique was developed to correct for the error in inductively coupled plasma atomic emission and mass spectrometric measurements arising from a difference in volatility between the sample analyte compounds and standards. The technique is based on the measurement of the analyte signal at two spray-chamber temperatures. A volatility correction factor is then estimated from a linear correlation between the reciprocal of a correction factor and the relative change in intensity resulting from measurements at two spray-chamber temperatures. Tests with organosilicon and organochlorine compounds demonstrate a significant decrease (from 2 to 30 times) in error after correction. The technique requires no prior knowledge of the chemical structure of the analyte.

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