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DOI: 10.1039/A806767H (Paper) Reference Section for: J. Anal. At. Spectrom., 1999, 14, 455-459

A survey of novel X-ray analysis methods

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Jun Kawai

Abstract

Five novel X-ray analysis methods recently developed in the author's research group are surveyed: extended X-ray emission fine structure (EXEFS), depth-selective X-ray absorption fine structure (XAFS), X-ray fluorescence holography (XFH), X-ray Raman and total reflection X-ray photoelectron spectroscopy (TRXPS). Some of these methods are completely new and others are modified existing methods, and all of them are easily applicable to practical chemical state analysis.

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