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DOI: 10.1039/A809067J (Paper) Reference Section for: Anal. Commun., 1999, 36, 17-18

Investigation of imaging X-ray photoelectron spectroscopy for surface analysis of atmospheric particulates

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Bernie M. Hutton and David E. Williams

Abstract

X-Ray photoelectron spectroscopy (XPS) is used to investigate surface species on atmospheric particulates as part of an investigation into the sources and health effects of such particulates. Oxygen and carbon species dominate the surface with trace quantities of Na+, NO3–, Cl– and SO42–. Multiple species for carbon and oxygen were evident, with major species identified as oxidised carbon, graphitic/aliphatic carbon and ruthenium oxide or a carbide. The potential of imaging XPS to show localised variation of surface species across atmospheric particulates is demonstrated.

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