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DOI: 10.1039/A703491A (Paper) Reference Section for: J. Anal. At. Spectrom., 1998, 13, 13-16

Reduction of water loading effects in inductively coupled plasma mass spectrometry by a Nafion membrane dryer device

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Neil Fitzgerald, Julian F. Tyson and David A. Leighty

Abstract

A multi-strand Nafion® dryer, located between the spray chamber and torch of a plasma source mass spectrometer, removed about 97% of the total mass of water leaving the spray chamber. A significant reduction in the ratio of the oxide signal to that of the metal for cerium and barium was observed. The argon oxide and hydroxide signals at m/z 56 and 57, respectively, were also decreased by about a factor of 10 for m/z 56. In turn, an improvement in the detection limit for iron at this m/z by about a factor of 5 was obtained. The use of the dryer did not require re-optimization of the instrument operating conditions and, for the relatively clean solutions introduced by flow injection used in this study, did not cause any significant memory effect or peak broadening.

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