A Brilliant Future for Microanalysis?†

Abstract

The ability to measure trace element distributions on the microscale is often critical to our understanding of large scale geological processes. As the number of different instruments and techniques capable of trace element analysis increases the choice of analytical method is becoming less clear. Although most techniques have 1 micrometre spatial resolution as their ultimate goal it is clear that the analytical depth is determined by sample thickness (proton probe and synchrotron XRF) or analytical volume (ion probe and laser ablation-ICP-MS) considerations. Thus ability to produce brighter and smaller beams also requires significant improvement in the detection of secondary particles. Provided analytical considerations, such as precision or detectibility are met, the eventual choice between competing techniques may well be more mundane aspects such as ease of access and cost.

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