Sensitivity enhancement effects of organic reagents on ytterbium, aluminium and chromium in atomic absorption spectrometry

Abstract

The sensitivity enhancement effects of organic reagents and surfactants on Yb, Al and Cr in atomic absorption spectrometry and also the mechanism of enhancement for the ternary system of Yb are studied. Results from X-ray diffraction and mass spectrometry indicate the existence of a new substance differing from ytterbium–sodium dodecyl sulfate or ytterbium–sulfosalicylic acid, which is very easily atomized. The surfactants decreased the surface energy of the solution and added to the effect of organic reagents. The sensitivities of Yb, Al and Cr increased 50-, 10- and 7.6-fold, respectively, and interferences were greatly reduced.