Issue 24, 1984

Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry: evidence for charge-induced damage in insulators

Abstract

A comparison of the secondary ion mas spectra obtained and the surface damage caused by ion and atom bombardment of polystyrene and niobium pentoxide shows that ion bombardment causes significantly more disruption for the surface structure of low conductivity materials than does atom bombardment.

Article information

Article type
Paper

J. Chem. Soc., Chem. Commun., 1984, 1684-1686

Atom (fast atom bombardment) compared to ion-induced static secondary ion mass spectrometry: evidence for charge-induced damage in insulators

A. Brown, J. A. van den Berg and J. C. Vickerman, J. Chem. Soc., Chem. Commun., 1984, 1684 DOI: 10.1039/C39840001684

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