Issue 4, 1978

Second-order effects observed in the electron spin resonance spectra of methyl radicals stabilised on silica at 77 K

Abstract

A marked dependence of e.s.r. spectral line width on surface coverage has been observed in methyl radicals stabilised on silica surfaces; at low surface coverage partial resolution of the second-order splitting is obtained, although the intensity of the lines appears not to agree with the theoretical 1 : 2 ratio; a computer simulation of this effect shows that the observed results are consistent with theory provided that both the line width and separation are considered.

Article information

Article type
Paper

J. Chem. Soc., Chem. Commun., 1978, 164-165

Second-order effects observed in the electron spin resonance spectra of methyl radicals stabilised on silica at 77 K

D. Oduwole, J. D. Barnes and B. Wiseall, J. Chem. Soc., Chem. Commun., 1978, 164 DOI: 10.1039/C39780000164

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