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“Depth-Profiling” and Quantitative Characterization of the Size, Composition, Shape, Density, and Morphology of Fine Particles with SPLAT, a Single-Particle Mass Spectrometer

By Zelenyuk, Alla; Yang, Juan; Song, Chen; Zaveri, Rahul A; Imre, Dan

Publication Date: 2008

Journal: The journal of physical chemistry.

Volume: 112

Issue: 4

Page: 669-677

ISSN: 1089-5639

Resource: Article

DOI: 10.1021/jp077308y

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American Chemical Society Journals
Available from 01/01/1997 volume: 101 issue: 1.
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