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Issue 42, 2019
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Order–disorder transformation of intercalated cations triggering huge negative thermal expansion, switchable dielectrics and ion conduction near room temperature in a 2D vanadium oxide hybrid

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Abstract

Zero/negative thermal expansion (ZTE/NTE) materials are significantly desired in many applications; however, it is still a tremendous challenge to theoretically predict and successfully achieve new families of ZTE/NTE materials via rational structural designs. Herein, we present a new low-thermal expansion/NTE material, i.e. a lamellar vanadium oxide hybrid [C3H12N2][V4O10] consisting of mixed-valence {V4O102−} monolayers and propane-1,3-diammonium cations in the interlayers. The inorganic layer is parallel to the (001) plane and comprises edge-sharing VO5 square pyramids linked together via corner-sharing VO4 tetrahedra. The hybrid shows a low thermal expansion coefficient (∼10−6 K−1) in the wide temperature range of 90–250 K and a colossal NTE (∼−600 × 10−6 K−1) between 293 and 330 K. Moreover, a reversible thermal anomaly occurs at ∼328/316 K upon heating/cooling, associated with a structural phase transition, which gives rise to switchable dielectric and ion-conducting properties; this study provides a new method for the exploration of lamellar vanadium oxide hybrids as new low-thermal expansion/NTE, switchable dielectric and ion-conducting multifunctional materials.

Graphical abstract: Order–disorder transformation of intercalated cations triggering huge negative thermal expansion, switchable dielectrics and ion conduction near room temperature in a 2D vanadium oxide hybrid

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Publication details

The article was received on 05 Sep 2019, accepted on 30 Sep 2019 and first published on 01 Oct 2019


Article type: Paper
DOI: 10.1039/C9TC04911H
J. Mater. Chem. C, 2019,7, 13243-13252

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    Order–disorder transformation of intercalated cations triggering huge negative thermal expansion, switchable dielectrics and ion conduction near room temperature in a 2D vanadium oxide hybrid

    Z. Yao, Y. Qian, Q. Ren, G. Zhang, J. Zhang, W. Liu, H. Luo and X. Ren, J. Mater. Chem. C, 2019, 7, 13243
    DOI: 10.1039/C9TC04911H

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