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Issue 40, 2019
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Mechanical probing of ferroelectrics at the nanoscale

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Mechanical properties of ferroelectric materials at the nanoscale have received growing interest over the past years due to new developments in scientific instrumentation and novel materials that allow for the study of so far scarcely investigated and/or hidden nanoscale phenomena. The use of atomic force microscopy (AFM) as the main investigation tool has shed new light onto various areas of interest, from non-destructive probing of Young's modulus to mechanically triggered phase transitions at nanoscale regions in ferroelectrics. Together with various theoretical approaches, these scanning probe microscopy based concepts provide a powerful platform for nanoscale mechanical property studies. Here we provide an overview of recent developments and investigations, and give an outlook to future opportunities in this research area.

Graphical abstract: Mechanical probing of ferroelectrics at the nanoscale

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Article information

20 May 2019
25 Sep 2019
First published
30 Sep 2019

J. Mater. Chem. C, 2019,7, 12441-12462
Article type
Review Article

Mechanical probing of ferroelectrics at the nanoscale

Y. Heo, P. Sharma, Y. Y. Liu, J. Y. Li and J. Seidel, J. Mater. Chem. C, 2019, 7, 12441
DOI: 10.1039/C9TC02661D

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