Issue 10, 2016

Facile patterning of amorphous indium oxide thin films based on a gel-like aqueous precursor for low-temperature, high performance thin-film transistors

Abstract

A “green precursor” and a “green patterning technique” were used to fabricate low temperature processed indium oxide (InOx) semiconductors. For the InOx precursor, chloride ligand-based indium(III) was dissolved in deionized (DI) water without any additives to form a gel-like precursor. The as-spin-coated precursor films could be facilely patterned using the “green patterning technique”, which requires only ultraviolet (UV) irradiation and DI water. A systematic study was carried out to investigate the chemical reaction of the chloride-based precursor films as well as the semiconductor properties. It was found that UV irradiation and water treatment not only helped to transform In–Cl into In–OH, but also helped to remove the Cl-related impurities. It led to the activation of InOx films at temperatures as low as 180 °C. The mobility of InOx TFTs based on an anodized aluminium oxide (AlOx:Nd) insulator with patterning was improved by more than 1 order compared to that without patterning at an annealing temperature of 280 °C. In addition, flexible InOx TFTs on polyimide (PI) substrates were demonstrated. They showed only a little degradation in the subthreshold region of the transfer curve even at a bending curvature (R) of 5 mm.

Graphical abstract: Facile patterning of amorphous indium oxide thin films based on a gel-like aqueous precursor for low-temperature, high performance thin-film transistors

Supplementary files

Article information

Article type
Paper
Submitted
04 Dec 2015
Accepted
08 Feb 2016
First published
09 Feb 2016

J. Mater. Chem. C, 2016,4, 2072-2078

Facile patterning of amorphous indium oxide thin films based on a gel-like aqueous precursor for low-temperature, high performance thin-film transistors

Y. Li, L. Lan, P. Xiao, Z. Lin, S. Sun, W. Song, E. Song, P. Gao, P. Zhang and J. Peng, J. Mater. Chem. C, 2016, 4, 2072 DOI: 10.1039/C5TC04107D

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