Jump to main content
Jump to site search

Issue 5, 2019
Previous Article Next Article

The 3D morphological stability of P3HT nanowire-based bulk heterojunction thin films against light irradiation quantitatively resolved by TEM tomography

Author affiliations

Abstract

Although polymer solar cells (PSCs) continue to improve, with advances in power conversion efficiencies of 15% and beyond, intrinsic device stability in air under sunlight remains a challenge for commercialization. As the key parameter determining PSC performance relies on a bicomponent nanostructured active layer morphology, we investigate the stability of bulk heterojunction (BHJ) thin films composed of preassembled poly(3-hexyl-thiophene) (P3HT) nanowires (NWs) and [6,6]-phenyl-C-71-butyric acid methyl ester (PC71BM) under light irradiation. The three-dimensional (3D) morphological changes caused by light-derived chemical oxidation and degradation are visualized and interpreted using 3D transmission electron microscopy combined with photo-physical characterization. Quantitative analysis of the phase separation and percolation pathways for efficient charge transport is performed. Two solution-processed NW-based thin films prepared via crystallization-driven assembly of P3HT in the presence or absence of PC71BM were compared with conventional P3HT/PC71BM blend films in terms of morphological instability against light irradiation. The introduction of pre-assembled NWs with tight packing of P3HT in thin films with PC71BM reduces the morphological degradation of BHJ thin films.

Graphical abstract: The 3D morphological stability of P3HT nanowire-based bulk heterojunction thin films against light irradiation quantitatively resolved by TEM tomography

Back to tab navigation

Supplementary files

Publication details

The article was received on 24 Nov 2018, accepted on 07 Jan 2019 and first published on 07 Jan 2019


Article type: Communication
DOI: 10.1039/C8TA11322J
J. Mater. Chem. A, 2019,7, 2027-2033

  •   Request permissions

    The 3D morphological stability of P3HT nanowire-based bulk heterojunction thin films against light irradiation quantitatively resolved by TEM tomography

    S. Jin, J. Nam, C. E. Song, H. Chung, B. Kim and E. Lee, J. Mater. Chem. A, 2019, 7, 2027
    DOI: 10.1039/C8TA11322J

Search articles by author

Spotlight

Advertisements