Issue 14, 2012

Hard X-rays meet soft matter: when bottom-up and top-down get along well

Abstract

The combined approach of bottom-up and top-down routes allows direct soft matter patterning and fabrication of devices using faster and more versatile protocols. In this research news, we briefly describe some of the fundamentals, development, recent progress and perspectives in the fabrication and patterning of functional nanostructured materials by interaction with high energy X-rays.

Graphical abstract: Hard X-rays meet soft matter: when bottom-up and top-down get along well

Article information

Article type
Emerging Area
Submitted
24 Oct 2011
Accepted
21 Dec 2011
First published
30 Jan 2012

Soft Matter, 2012,8, 3722-3729

Hard X-rays meet soft matter: when bottom-up and top-down get along well

P. Innocenzi, L. Malfatti and P. Falcaro, Soft Matter, 2012, 8, 3722 DOI: 10.1039/C2SM07028F

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