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Issue 33, 2016
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Equal variations of the Fermi level and work function in graphene at the nanoscale

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Abstract

If surface effects are neglected, any change of the Fermi level in a semiconductor is expected to result in an equal and opposite change of the work function. However, this is in general not observed in three-dimensional semiconductors, because of Fermi level pinning at the surface. By combining Kelvin probe force microscopy and scanning tunneling spectroscopy on single layer graphene, we measure both the local work function and the charge carrier density. The one-to-one equivalence of changes in the Fermi level and the work function is demonstrated to accurately hold in single layer graphene down to the nanometer scale.

Graphical abstract: Equal variations of the Fermi level and work function in graphene at the nanoscale

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Publication details

The article was received on 07 Jun 2016, accepted on 26 Jul 2016 and first published on 29 Jul 2016


Article type: Communication
DOI: 10.1039/C6NR04606A
Citation: Nanoscale, 2016,8, 15162-15166

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    Equal variations of the Fermi level and work function in graphene at the nanoscale

    S. Samaddar, J. Coraux, S. C. Martin, B. Grévin, H. Courtois and C. B. Winkelmann, Nanoscale, 2016, 8, 15162
    DOI: 10.1039/C6NR04606A

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