Issue 3, 2016

The core contribution of transmission electron microscopy to functional nanomaterials engineering

Abstract

Research on nanomaterials and nanostructured materials is burgeoning because their numerous and versatile applications contribute to solve societal needs in the domain of medicine, energy, environment and STICs. Optimizing their properties requires in-depth analysis of their structural, morphological and chemical features at the nanoscale. In a transmission electron microscope (TEM), combining tomography with electron energy loss spectroscopy and high-magnification imaging in high-angle annular dark-field mode provides access to all features of the same object. Today, TEM experiments in three dimensions are paramount to solve tough structural problems associated with nanoscale matter. This approach allowed a thorough morphological description of silica fibers. Moreover, quantitative analysis of the mesoporous network of binary metal oxide prepared by template-assisted spray-drying was performed, and the homogeneity of amino functionalized metal–organic frameworks was assessed. Besides, the morphology and internal structure of metal phosphide nanoparticles was deciphered, providing a milestone for understanding phase segregation at the nanoscale. By extrapolating to larger classes of materials, from soft matter to hard metals and/or ceramics, this approach allows probing small volumes and uncovering materials characteristics and properties at two or three dimensions. Altogether, this feature article aims at providing (nano)materials scientists with a representative set of examples that illustrates the capabilities of modern TEM and tomography, which can be transposed to their own research.

Graphical abstract: The core contribution of transmission electron microscopy to functional nanomaterials engineering

Supplementary files

Article information

Article type
Feature Article
Submitted
12 Aug 2015
Accepted
18 Nov 2015
First published
17 Dec 2015

Nanoscale, 2016,8, 1260-1279

Author version available

The core contribution of transmission electron microscopy to functional nanomaterials engineering

S. Carenco, S. Moldovan, L. Roiban, I. Florea, D. Portehault, K. Vallé, P. Belleville, C. Boissière, L. Rozes, N. Mézailles, M. Drillon, C. Sanchez and O. Ersen, Nanoscale, 2016, 8, 1260 DOI: 10.1039/C5NR05460E

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