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Issue 28, 2015
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Elastic properties of van der Waals epitaxy grown bismuth telluride 2D nanosheets

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Abstract

Bismuth telluride (Bi2Te3) two-dimensional (2D) nanosheets prepared by van der Waals epitaxy were successfully detached, transferred, and suspended for nano-indentation measurements to be performed on freestanding circular nanosheets. The Young's modulus acquired by fitting linear elastic behaviors of 26 samples (thickness: 5–14 nm) is only 11.7–25.7 GPa, significantly smaller than the bulk in-plane Young's modulus (50–55 GPa). Compliant and robust Bi2Te3 2D nanosheets suggest the feasibility of the elastic strain engineering of topological surface states.

Graphical abstract: Elastic properties of van der Waals epitaxy grown bismuth telluride 2D nanosheets

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Article information


Submitted
19 May 2015
Accepted
17 Jun 2015
First published
19 Jun 2015

Nanoscale, 2015,7, 11915-11921
Article type
Communication
Author version available

Elastic properties of van der Waals epitaxy grown bismuth telluride 2D nanosheets

L. Guo, H. Yan, Q. Moore, M. Buettner, J. Song, L. Li, P. T. Araujo and H. Wang, Nanoscale, 2015, 7, 11915
DOI: 10.1039/C5NR03282B

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