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Issue 5, 2015
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Correlative electron and X-ray microscopy: probing chemistry and bonding with high spatial resolution

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Abstract

Two powerful and complementary techniques for chemical characterisation of nanoscale systems are electron energy-loss spectroscopy in the scanning transmission electron microscope, and X-ray absorption spectroscopy in the scanning transmission X-ray microscope. A correlative approach to spectro-microscopy may not only bridge the gaps in spatial and spectral resolution which exist between the two instruments, but also offer unique opportunities for nanoscale characterisation. This review will discuss the similarities of the two spectroscopy techniques and the state of the art for each microscope. Case studies have been selected to illustrate the benefits and limitations of correlative electron and X-ray microscopy techniques. In situ techniques and radiation damage are also discussed.

Graphical abstract: Correlative electron and X-ray microscopy: probing chemistry and bonding with high spatial resolution

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Article information


Submitted
08 Oct 2014
Accepted
07 Dec 2014
First published
08 Dec 2014

Nanoscale, 2015,7, 1534-1548
Article type
Review Article
Author version available

Correlative electron and X-ray microscopy: probing chemistry and bonding with high spatial resolution

A. E. Goode, A. E. Porter, M. P. Ryan and D. W. McComb, Nanoscale, 2015, 7, 1534
DOI: 10.1039/C4NR05922K

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