Issue 16, 2020

Evaluation of microflow configurations for scale inhibition and serial X-ray diffraction analysis of crystallization processes

Abstract

The clean and reproducible conditions provided by microfluidic devices are ideal sample environments for in situ analyses of chemical and biochemical reactions and assembly processes. However, the small size of microchannels makes investigating the crystallization of poorly soluble materials on-chip challenging due to crystal nucleation and growth that result in channel fouling and blockage. Here, we demonstrate a reusable insert-based microfluidic platform for serial X-ray diffraction analysis and examine scale formation in response to continuous and segmented flow configurations across a range of temperatures. Under continuous flow, scale formation on the reactor walls begins almost immediately on mixing of the crystallizing species, which over time results in occlusion of the channel. Depletion of ions at the start of the channel results in reduced crystallization towards the end of the channel. Conversely, segmented flow can control crystallization, so it occurs entirely within the droplet. Consequently, the spatial location within the channel represents a temporal point in the crystallization process. Whilst each method can provide useful crystallographic information, time-resolved information is lost when reactor fouling occurs and changes the solution conditions with time. The flow within a single device can be manipulated to give a broad range of information addressing surface interaction or solution crystallization.

Graphical abstract: Evaluation of microflow configurations for scale inhibition and serial X-ray diffraction analysis of crystallization processes

Supplementary files

Article information

Article type
Paper
Submitted
09 Mar 2020
Accepted
07 Jul 2020
First published
07 Jul 2020
This article is Open Access
Creative Commons BY license

Lab Chip, 2020,20, 2954-2964

Evaluation of microflow configurations for scale inhibition and serial X-ray diffraction analysis of crystallization processes

M. A. Levenstein, Y. Kim, L. Hunter, C. Anduix-Canto, C. González Niño, S. J. Day, S. Li, W. J. Marchant, P. A. Lee, C. C. Tang, M. Burghammer, F. C. Meldrum and N. Kapur, Lab Chip, 2020, 20, 2954 DOI: 10.1039/D0LC00239A

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