Issue 7, 2012

Low-temperature, solution-processed molybdenum oxide hole-collection layer for organic photovoltaics

Abstract

We have utilized a commercially available metal–organic precursor to develop a new, low-temperature, solution-processed molybdenum oxide (MoOx) hole-collection layer (HCL) for organic photovoltaic (OPV) devices that is compatible with high-throughput roll-to-roll manufacturing. Thermogravimetric analysis indicates complete decomposition of the metal–organic precursor by 115 °C in air. Acetonitrile solutions spin-cast in a N2 atmosphere and annealed in air yield continuous thin films of MoOx. Ultraviolet, inverse, and X-ray photoemission spectroscopies confirm the formation of MoOx and, along with Kelvin probe measurements, provide detailed information about the energetics of the MoOx thin films. Incorporation of these films into conventional architecture bulk heterojunction OPV devices with poly(3-hexylthiophene) and [6,6]-phenyl-C61 butyric acid methyl ester afford comparable power conversion efficiencies to those obtained with the industry-standard material for hole injection and collection: poly(3,4-ethylenedioxythiophene):poly(styrene sulfonate) (PEDOT:PSS). The MoOx HCL devices exhibit slightly reduced open circuit voltages and short circuit current densities with respect to the PEDOT:PSS HCL devices, likely due in part to charge recombination at Mo5+ gap states in the MoOx HCL, and demonstrate enhanced fill factors due to reduced series resistance in the MoOx HCL.

Graphical abstract: Low-temperature, solution-processed molybdenum oxide hole-collection layer for organic photovoltaics

Supplementary files

Article information

Article type
Paper
Submitted
30 Sep 2011
Accepted
18 Dec 2011
First published
09 Jan 2012

J. Mater. Chem., 2012,22, 3249-3254

Low-temperature, solution-processed molybdenum oxide hole-collection layer for organic photovoltaics

S. R. Hammond, J. Meyer, N. E. Widjonarko, P. F. Ndione, A. K. Sigdel, A. Garcia, A. Miedaner, M. T. Lloyd, A. Kahn, D. S. Ginley, J. J. Berry and D. C. Olson, J. Mater. Chem., 2012, 22, 3249 DOI: 10.1039/C2JM14911G

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