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Issue 11, 2011
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Ultrahigh density data storage based on organic materials with SPM techniques

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Abstract

With the ever-increasing demand of expansive storage capacity and the continuous miniaturization of optoelectronic device, ultrahigh density data storage has attracted intensive research interest. In this feature article, recent progress on the developments of ultrahigh density data storage based on organic materials is summarized and discussed, it especially focuses on materials for data recording using scanning tunneling microscopy (STM), atom force microscopy (AFM), and scanning near-field microscopy (SNOM). The focus is placed on the rational design and synthesis of new organic recording media to realize and improve nanoscale data storage. In addition, an outlook in this field is also discussed.

Graphical abstract: Ultrahigh density data storage based on organic materials with SPM techniques

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Publication details

The article was received on 30 Jul 2010, accepted on 19 Oct 2010 and first published on 03 Dec 2010


Article type: Feature Article
DOI: 10.1039/C0JM02471F
J. Mater. Chem., 2011,21, 3522-3533

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    Ultrahigh density data storage based on organic materials with SPM techniques

    Y. Ma, Y. Wen and Y. Song, J. Mater. Chem., 2011, 21, 3522
    DOI: 10.1039/C0JM02471F

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