Issue 4, 2013
From the journal:

Journal of Analytical Atomic Spectrometry

Reproducibility of CIGS thin film analysis by laser-induced breakdown spectroscopy

Jung-Hwan In,a   Chan-Kyu Kim,a   Seok-Hee Leea  and  Sungho Jeong*a  

* Corresponding authors

a School of Mechatronics, Gwangju Institute of Science and Technology, 1 Oryong-dong Buk-gu, Gwangju 500-712, Republic of Korea
E-mail: shjeong@gist.ac.kr
Fax: +82 62 715 2384
Tel: +82 62 715 2393

Abstract

The reproducibility of an elemental analysis of thin CIGS solar cell films by laser-induced breakdown spectroscopy (LIBS) is assessed. A Q-switched Nd:YAG laser (λ = 532 nm, τ = 5 ns, top-hat profile) and an ICCD detector were used for the LIBS measurements. It was shown that the concentration ratios and depth profile of a CIGS sample with unknown composition could be predicted with high precision by using the calibration curves generated with reference CIGS samples. The spot-to-spot relative standard deviation of 1.4% could be achieved for (Ga + In)/Cu at the gate delay of 0.1 μs condition, demonstrating that LIBS can be applied for real time monitoring of the elemental composition of CIGS thin films.

Graphical abstract: Reproducibility of CIGS thin film analysis by laser-induced breakdown spectroscopy

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Article information

DOI
https://doi.org/10.1039/C3JA30298A
Article type
Paper
Submitted
15 Oct 2012
Accepted
05 Feb 2013
First published
05 Feb 2013

J. Anal. At. Spectrom., 2013,28, 473-481

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Reproducibility of CIGS thin film analysis by laser-induced breakdown spectroscopy

J. In, C. Kim, S. Lee and S. Jeong, J. Anal. At. Spectrom., 2013, 28, 473 DOI: 10.1039/C3JA30298A

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