Jump to main content
Jump to site search

Issue 11, 2012
Previous Article Next Article

Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis

Author affiliations

Abstract

We report on the trace analysis of copper and iron impurities in multicrystalline silicon wafers with the microbeam X-ray fluorescence (μ-XRF) technique. The efficiency of solar cells, which are based on multicrystalline silicon wafers, is strongly influenced by minor contamination with metals such as copper and iron. Application of compound refractive lenses (CRLs) in μ-XRF allows versatile two-dimensional mapping of relevant contaminations and localization of their sites of deposition. In this context, the measured bulk average limit of detection (LOD) was one picogram of iron and copper per gram of silicon. We suggest that μ-XRF is a valuable tool for non-destructive spatial (3D) quantification of metal impurities in a wide range of materials and devices whose functioning could be critically affected by impurities.

Graphical abstract: Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis

Back to tab navigation

Publication details

The article was received on 26 Jun 2012, accepted on 04 Sep 2012 and first published on 04 Sep 2012


Article type: Paper
DOI: 10.1039/C2JA30188A
J. Anal. At. Spectrom., 2012,27, 1875-1881

  •   Request permissions

    Impurities in multicrystalline silicon wafers for solar cells detected by synchrotron micro-beam X-ray fluorescence analysis

    G. Buzanich, M. Radtke, U. Reinholz, H. Riesemeier, A. F. Thünemann and C. Streli, J. Anal. At. Spectrom., 2012, 27, 1875
    DOI: 10.1039/C2JA30188A

Search articles by author

Spotlight

Advertisements