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Issue 5, 2011
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SRXRF-measurements at non-planar objects: automatic determination of the angle of incidence of the exciting X-ray

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Abstract

For quantitative SRXRF measurements the angle of incidence of the incoming X-ray beam is an important factor. When the sample is focused by a long-range-microscope, the determination of the angle can be automatized using a simple algorithm. This was developed to improve the orientation of especially round or ornate samples. As a side effect the three dimensional surface can be reconstructed, too.

Graphical abstract: SRXRF-measurements at non-planar objects: automatic determination of the angle of incidence of the exciting X-ray

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Article information


Submitted
13 Dec 2010
Accepted
05 Jan 2011
First published
31 Jan 2011

J. Anal. At. Spectrom., 2011,26, 1088-1089
Article type
Technical Note

SRXRF-measurements at non-planar objects: automatic determination of the angle of incidence of the exciting X-ray

C. Grunewald, M. Radtke, U. Reinholz, G. Buzanich and H. Riesemeier, J. Anal. At. Spectrom., 2011, 26, 1088
DOI: 10.1039/C0JA00237B

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