Issue 4, 2008
From the journal:

Journal of Analytical Atomic Spectrometry

Reply to ‘Comment on “Calibration of nitrogen content for GDOES depth profiling of complex nitride coatings”’ by V. Hoffmann, J. Anal. At. Spectrom., 2008, 23, DOI: 10.1039/b713743p

Dr Ramon Escobar Galindoa  

a Instituto de Ciencia de Materiales de Madrid (CSIC), Cantoblanco, Madrid, Spain
E-mail: rescobar@icmm.csic.es
Fax: +34 91 372 06 23
Tel: +34 91 372 14 20 (ext. 304)

Abstract

The first page of this article is displayed as the abstract.

Reply to ‘Comment on “Calibration of nitrogen content for GDOES depth profiling of complex nitride coatings”’ by V. Hoffmann, J. Anal. At. Spectrom., 2008, 23, DOI: 10.1039/b713743p

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Article information

DOI
https://doi.org/10.1039/B715137N
Article type
Letter
Submitted
01 Oct 2007
Accepted
19 Dec 2007
First published
24 Jan 2008

J. Anal. At. Spectrom., 2008,23, 593-594

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Reply to ‘Comment on “Calibration of nitrogen content for GDOES depth profiling of complex nitride coatings”’ by V. Hoffmann, J. Anal. At. Spectrom., 2008, 23, DOI: 10.1039/b713743p

D. R. Escobar Galindo, J. Anal. At. Spectrom., 2008, 23, 593 DOI: 10.1039/B715137N

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