Issue 1, 2005

ICP-MS analysis of high purity molybdenum used as SI-traceable standard of high metrological quality

Abstract

The need, concept and technical approach for the certification of SI-traceable standards of high metrological quality for chemical analysis of the elements is briefly explained. As an example of problems occurring in the certification of these standards, special technical aspects related to the analysis of high purity Mo by ICP-MS, namely blank reduction for Na, Li and Ni by protective coating of the cones with silicon, as well as dealing with the interferences from the Mo matrix, are discussed.

Graphical abstract: ICP-MS analysis of high purity molybdenum used as SI-traceable standard of high metrological quality

Article information

Article type
Paper
Submitted
30 Jun 2004
Accepted
17 Nov 2004
First published
02 Dec 2004

J. Anal. At. Spectrom., 2005,20, 28-34

ICP-MS analysis of high purity molybdenum used as SI-traceable standard of high metrological quality

H. Kipphardt, M. Czerwensky and R. Matschat, J. Anal. At. Spectrom., 2005, 20, 28 DOI: 10.1039/B409973G

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