Issue 22, 2018

The blocking effect of surface dislocations on oxygen tracer diffusion in SrTiO3

Abstract

The existence of a polishing-induced damaged zone at the surface of standard, nominally undoped, single-crystal SrTiO3 is exploited in diffusion studies in order to investigate the interaction between oxygen vacancies and dislocations. Tracer diffusion profiles for such crystals are proposed to exhibit three features: a short feature arising from a surface space-charge layer; an intermediate, longer feature arising from the high density of dislocations in the damaged zone; and finally, a much longer feature corresponding to diffusion in the homogeneous bulk crystal. Quantitative information is provided by finite-element-method calculations. First, the distribution of oxygen vacancies in a sample in which space-charge zones depleted of oxygen vacancies form at dislocations and at the sample surface is calculated; subsequently, oxygen tracer diffusion profiles for such vacancy distributions are simulated. The proposed model is experimentally validated by performing conventional oxygen isotope exchange and depth-profiling experiments on commercial single-crystal SrTiO3. In this way, we confirm directly that arrays of dislocations in acceptor-doped SrTiO3, by virtue of the attendant space-charge tubes, hinder the diffusion of oxygen. Finally, in order to aid the prediction of oxygen tracer diffusion profiles in polished perovskite single-crystal substrates, we suggest a one-dimensional continuum approach that takes account of the complex, three-dimensional diffusion problem posed by dislocation arrays with depletion space-charge tubes.

Graphical abstract: The blocking effect of surface dislocations on oxygen tracer diffusion in SrTiO3

Article information

Article type
Paper
Submitted
06 Apr 2018
Accepted
18 May 2018
First published
18 May 2018

Phys. Chem. Chem. Phys., 2018,20, 15455-15463

The blocking effect of surface dislocations on oxygen tracer diffusion in SrTiO3

H. Schraknepper, T. E. Weirich and R. A. De Souza, Phys. Chem. Chem. Phys., 2018, 20, 15455 DOI: 10.1039/C8CP02191K

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