Jump to main content
Jump to site search

Issue 4, 2016
Previous Article Next Article

The effect of recombination under short-circuit conditions on the determination of charge transport properties in nanostructured photoelectrodes

Author affiliations

Abstract

We report on the commonly unaccounted for process of recombination under short-circuit conditions in nanostructured photoelectrodes with special attention to the charge collection efficiency. It is observed that when recombination under short circuit conditions is significant, small perturbation methods overestimate the charge-collection efficiency, which is related to the inaccurate determination of the electron diffusion coefficient and diffusion length.

Graphical abstract: The effect of recombination under short-circuit conditions on the determination of charge transport properties in nanostructured photoelectrodes

Back to tab navigation

Associated articles

Supplementary files

Article information


Submitted
23 Oct 2015
Accepted
13 Dec 2015
First published
21 Dec 2015

Phys. Chem. Chem. Phys., 2016,18, 2303-2308
Article type
Communication
Author version available

The effect of recombination under short-circuit conditions on the determination of charge transport properties in nanostructured photoelectrodes

J. Villanueva-Cab, J. A. Anta and G. Oskam, Phys. Chem. Chem. Phys., 2016, 18, 2303
DOI: 10.1039/C5CP06466J

Social activity

Search articles by author

Spotlight

Advertisements