An ellipsometry study of silicananoparticle layers at the water surface
Abstract
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* Corresponding authors
a Laboratoire de Physique des Solides, Université Paris-Sud, UMR CNRS 8502, Bâtiment 510, 91405 Orsay cedex, France
b Laboratory of Materials Science in Space, Northwestern Polytechnical University, Xi’an, China
c Surfactant & Colloid Group, Department of Chemistry, University of Hull, Hull, UK
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D. Zang, A. Stocco, D. Langevin, B. Wei and B. P. Binks, Phys. Chem. Chem. Phys., 2009, 11, 9522 DOI: 10.1039/B907903C
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