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Issue 24, 2006
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Observation of mechanically induced luminescence from microparticles

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Abstract

We have invented a new device based on atomic force microscopy that measures the emission from a single microparticle by force direct application using the AFM probe, and successfully observed emission in the region of the elastic deformation, friction, and destructive deformation.

Graphical abstract: Observation of mechanically induced luminescence from microparticles

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Publication details

The article was received on 30 Mar 2006, accepted on 09 May 2006 and first published on 25 May 2006


Article type: Communication
DOI: 10.1039/B604656H
Phys. Chem. Chem. Phys., 2006,8, 2819-2822

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    Observation of mechanically induced luminescence from microparticles

    K. Sakai, T. Koga, Y. Imai, S. Maehara and C. Xu, Phys. Chem. Chem. Phys., 2006, 8, 2819
    DOI: 10.1039/B604656H

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