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Issue 8, 2018
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Experimental and numerical effects of active afterheater addition on the growth of langatate (La3Ga5.5Ta0.5O14) crystals by the Czochralski method

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Abstract

The Czochralski (Cz) technique under an argon/oxygen atmosphere has been used to grow 35 mm diameter La3Ga5.5Ta0.5O14 langatate (LGT) crystals along the Z-axis. Addition of an afterheater is proposed to improve the growth and crystal properties. Two furnace configurations, without and with an afterheater, are investigated experimentally and numerically. A global model for the entire furnace was used in investigating the mechanism of flow, heat transfer, melt–crystal interface shape and 3-d thermal stress considering the crystal anisotropy. Addition of the afterheater changes considerably the thermal field in the growth atmosphere. A decrease of 56% of the maximum von Mises stress and 30% of the interface convexity are found through the use of the afterheater. Experimentally, a more stable growth has been achieved and this resulted in a good quality crystal.

Graphical abstract: Experimental and numerical effects of active afterheater addition on the growth of langatate (La3Ga5.5Ta0.5O14) crystals by the Czochralski method

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Article information


Submitted
24 Nov 2017
Accepted
15 Jan 2018
First published
16 Jan 2018

CrystEngComm, 2018,20, 1110-1115
Article type
Paper

Experimental and numerical effects of active afterheater addition on the growth of langatate (La3Ga5.5Ta0.5O14) crystals by the Czochralski method

I. Lasloudji, F. Mokhtari, A. Nehari, G. Alombert-Goget and K. Lebbou, CrystEngComm, 2018, 20, 1110
DOI: 10.1039/C7CE02032E

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