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Issue 21, 2013
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Vertical Bridgman growth and optical properties of CdSiP2 crystals

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Abstract

Single crystals of CdSiP2 (CSP) with the dimension of 8 mm in diameter and 40 mm in length were successfully grown using vertical Bridgman method. Optical observations showed the presence of macro-defects including flaws and inclusions in the as-grown crystals. The macro-defects can be restrained through controlling the process of polycrystalline synthesis and growth parameters. For the crystals with improved qualities, the high-resolution X-ray diffraction measurement on the (004)-faced plate indicates that the full-width at half-maximum (FWHM) of the rocking curve is 34′′. The phase-matching curves calculated from refractive indices indicate that, for 1.064 μm pumping, the CSP crystal will produce a noncritically phase-matched output at 6.2 μm through a type-I parametric process, and a noncritically phase-matched output at 5.0 μm through a type-II parametric process. For 1.55 μm and 2.00 μm pumping, the crystal yields continuous tunability from 2 to 6.5 μm through a type-I parametric process. The absorption coefficients for e-polarized light at 1.064 μm, 1.55 μm and 2.0 μm of the as-grown CSP crystal are 0.53 cm−1, 0.39 cm−1, and 0.25 cm−1, respectively.

Graphical abstract: Vertical Bridgman growth and optical properties of CdSiP2 crystals

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Publication details

The article was received on 11 Dec 2012, accepted on 16 Mar 2013 and first published on 18 Mar 2013


Article type: Paper
DOI: 10.1039/C3CE27003C
Citation: CrystEngComm, 2013,15, 4255-4260

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    Vertical Bridgman growth and optical properties of CdSiP2 crystals

    G. Zhang, H. Ruan, X. Zhang, S. Wang and X. Tao, CrystEngComm, 2013, 15, 4255
    DOI: 10.1039/C3CE27003C

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