Issue 3, 1988

Crystal structure determination of Rh6(CO)14(dppm) using intensity data from synchrotron radiation laue diffraction photographs

Abstract

Laue diffraction patterns, using the full white beam from a synchrotron source, can be recorded on film with exposure times of 1s or less; a comparatively small number of photographs taken with the crystal in different orientations can record a large proportion of the unique reflections, allowing a crystal structure to be determined fully from a set of films recorded within a period of 1–10 minutes.

Article information

Article type
Paper

J. Chem. Soc., Chem. Commun., 1988, 185-187

Crystal structure determination of Rh6(CO)14(dppm) using intensity data from synchrotron radiation laue diffraction photographs

J. A. Clucas, M. M. Harding and S. J. Maginn, J. Chem. Soc., Chem. Commun., 1988, 185 DOI: 10.1039/C39880000185

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