Issue 11, 2006
From the journal:

Analyst

Patterning of cantilevers with inverted dip-pen nanolithography: efforts toward combinatorial AFM

Shiau-Yin Wu,a   Richard Berkenbosch,a   Andrea Luia  and  John-Bruce D. Green*a  

* Corresponding authors

a Department of Chemistry, University of Alberta, Edmonton, Alberta Canada
E-mail: john.green@ualberta.ca
Fax: +1 (780) 492-8231
Tel: +1 (780) 492-7140

Abstract

We report patterning of AFM cantilevers by inverted dip-pen nanolithography, thereby markedly enhancing the development of combinatorial AFM as a high-throughput force-measuring instrument capable of determining interactions between opposing libraries of biomolecules.

Graphical abstract: Patterning of cantilevers with inverted dip-pen nanolithography: efforts toward combinatorial AFM

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Article information

DOI
https://doi.org/10.1039/B606749B
Article type
Communication
Submitted
12 May 2006
Accepted
01 Sep 2006
First published
06 Oct 2006

Analyst, 2006,131, 1213-1215

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Patterning of cantilevers with inverted dip-pen nanolithography: efforts toward combinatorial AFM

S. Wu, R. Berkenbosch, A. Lui and J. D. Green, Analyst, 2006, 131, 1213 DOI: 10.1039/B606749B

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