Bias-dependent layer-resolved Raman evidence for interfacial asymmetry in vertical graphene/MoSe2/graphene junctions on SiO2/Si substrates

Abstract

Vertical graphene/MoSe2/graphene (Gr/MoSe2/Gr) junctions are promising for tunable electronics as well as optoelectronics based on vertical transport. To identify the junction properties of a vertically stacked Gr/MoSe2/Gr junction on SiO2/Si, we combine in situ bias-dependent Raman spectroscopy with temperature-dependent transport measurements. At zero bias, the Raman response of the two graphene electrodes appears as a single overlapped feature. Under finite bias, this response separates into two distinct contributions, which allows layer-resolved extraction of the chemical potential shifts of the two graphene electrodes. The extracted shifts are strongly asymmetric, with Grbot showing a consistently smaller response than Grtop under both bias polarities. This result indicates that the junction is better described as an asymmetric back-to-back Schottky diode with a less electrostatically tunable bottom interface. The device also exhibits a clear hysteresis loop in the cyclic current–voltage characteristics, indicating history-dependent hysteretic transport characteristics. At room temperature, the transport remains nearly symmetric, but the polarity asymmetry becomes stronger at higher temperature. A plausible origin is an asymmetric junction formed by different defect environments at the two interfaces. MoSe2 can contain intrinsic Se vacancies. Upon additional exposure of the upper MoSe2 surface, some of these vacancy sites can undergo O substitution, whereas the lower interface can retain a stronger Se vacancy character. These in-gap Se vacancy states may contribute to Fermi level pinning. A temperature-dependent change in this pinning condition may further change the effective barrier profile and thereby enhance the transport asymmetry. These results show that interface quality and transfer history play a central role in determining the electrostatic response of vertical Gr/MoSe2/Gr heterostructures.

Graphical abstract: Bias-dependent layer-resolved Raman evidence for interfacial asymmetry in vertical graphene/MoSe2/graphene junctions on SiO2/Si substrates

Supplementary files

Article information

Article type
Paper
Submitted
27 Mar 2026
Accepted
02 Jun 2026
First published
15 Jun 2026
This article is Open Access
Creative Commons BY-NC license

J. Mater. Chem. C, 2026, Advance Article

Bias-dependent layer-resolved Raman evidence for interfacial asymmetry in vertical graphene/MoSe2/graphene junctions on SiO2/Si substrates

Y. Lee and J. Choi, J. Mater. Chem. C, 2026, Advance Article , DOI: 10.1039/D6TC01000H

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