Issue 42, 2025

Enhancing the reverse intersystem crossing (RISC) rates and efficiencies of MR-TADF emitters with a U-shaped molecular structure for solution-processed OLEDs

Abstract

Multi-resonance thermally activated delayed fluorescence (MR-TADF) emitters hold great potential for applications in organic light-emitting diodes (OLEDs). However, owing to their inherently rigid and planar molecular structures and the localized charge transfer (LCT) characteristics, these emitters typically exhibit poor solubility and low reverse intersystem crossing (RISC) rates, which are unfavorable for high-performance solution-processed OLEDs. Herein, we constructed three U-shaped MR-TADF emitters (BN-N-TTz, BN-N-PCz and BN-N-BN) by introducing triazine, phenylcarbazole and MR-TADF units at the 1- and 8-positions of a naphthalene ring. This U-shaped molecular architecture endows the emitters with excellent solubility. Moreover, this structure not only enhances spin–orbit coupling between the S1 and T1 states but also reduces the energy difference between the two states (ΔEST), thereby increasing RISC rates to as high as 3.17 × 105 s−1. Notably, the solution-processed OLED based on BN-N-BN achieved the highest EQE of 27.6% without sensitizers. This represents one of the best performances among solution-processed OLEDs based on MR-TADF emitters to date. This simple approach reveals the great potential for developing solution-processable emitters suitable for high-performance rigid and planar molecular structures.

Graphical abstract: Enhancing the reverse intersystem crossing (RISC) rates and efficiencies of MR-TADF emitters with a U-shaped molecular structure for solution-processed OLEDs

Supplementary files

Article information

Article type
Edge Article
Submitted
19 Jun 2025
Accepted
19 Sep 2025
First published
19 Sep 2025
This article is Open Access

All publication charges for this article have been paid for by the Royal Society of Chemistry
Creative Commons BY-NC license

Chem. Sci., 2025,16, 19956-19966

Enhancing the reverse intersystem crossing (RISC) rates and efficiencies of MR-TADF emitters with a U-shaped molecular structure for solution-processed OLEDs

S. Xu, W. Liu, A. Yan, X. Du, Y. Sun, J. Tao, G. Zhou, Z. Chen and X. Yang, Chem. Sci., 2025, 16, 19956 DOI: 10.1039/D5SC04507J

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