Overview of the characterization technique groups for submicroscopic structures from the micro-nano to atomic scale

Abstract

Structural characterization is essentially important in chemistry and materials science research, especially submicroscopic characterization from the micro-nano to atomic scale, which is a powerful foundation tool for investigating and understanding the properties and functions and establishing structure–activity relationships. This review details the advanced submicroscopic characterization technique groups based on the main line of material structure, encompassing both physical and chemical aspects, such as morphologies, pore structures, crystal structures, chemical compositions, oxidation states, coordination and electron structures, of functional solid materials based on SEM, AC-STEM, surface adsorption, XRD, EDS, XPS, XAFS, EELS, NMR and Mössbauer spectroscopy instruments. To track the dynamic evolution of the above-mentioned structures during various applications, in situ or operando characterization methodologies and equipment are further extensively discussed. Organizing these technologies into several coordinated groups not only provides comprehensive references for researchers in the fields of chemistry, materials science, and energy but also advances research and establishes technical foundations for the discovery of novel functional materials.