Issue 19, 2024

Engineered interface states and optical absorption of β-Ga2O3/4H-SiC heterojunctions by irradiation-induced oxygen defects from first-principles

Abstract

Designing high-performance β-Ga2O3/4H-SiC heterojunctions has been widely investigated in recent years due to their unique applications in photodetectors. Due to the low defect formation energy of oxygen vacancies, β-Ga2O3-based heterojunction photodetectors inevitably produce defects internally upon irradiaion accompanied by performance degradation, yet the underlying physics still remains elusive. Herein, we focus on investigating the influence of oxygen vacancy defects on electronic, optical and carrier transport properties of β-Ga2O3/4H-SiC heterojunctions to understand such degradation mechanisms using first-principles calculations. Our findings indicate that the irradiation-induced oxygen vacancies can significantly reduce the space charge region width of the heterojunction but slightly affect the electrostatic potential. When oxygen vacancies appear at the heterojunction boundary (β-Ga2O3 side), the bandgaps of both β-Ga2O3 and 4H-SiC decrease simultaneously. The interface states emerge when oxygen vacancies occur at the interface but do not affect the bandgaps. In addition, the oxygen vacancies could increase the optical absorption in the visible and ultraviolet bands, leading to more electron–hole pairs being quickly separated through the built-in electric field. Our calculations reveal the oxygen vacancy influence on the β-Ga2O3/4H-SiC heterojunction, which is helpful for analyzing photodetector failures and improving their performances.

Graphical abstract: Engineered interface states and optical absorption of β-Ga2O3/4H-SiC heterojunctions by irradiation-induced oxygen defects from first-principles

Article information

Article type
Paper
Submitted
25 Dec 2023
Accepted
05 Feb 2024
First published
06 Feb 2024

J. Mater. Chem. C, 2024,12, 7095-7102

Engineered interface states and optical absorption of β-Ga2O3/4H-SiC heterojunctions by irradiation-induced oxygen defects from first-principles

X. Zhang, X. Liang, H. Dong, J. Yang and L. Liu, J. Mater. Chem. C, 2024, 12, 7095 DOI: 10.1039/D3TC04768G

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