Issue 45, 2024

Fabrication of palladium-enriched metallic structures by direct focused He+ and Ne+ beam nanowriting from organometallic thin films: a comparison with Ga+ and e beams

Abstract

A direct nanowriting procedure using helium- and neon-focused ion beams and spin-coated organometallic thin films is introduced and applied to the fabrication of Pd-enriched metallic structures in a single lithography step. This process presents significant advantages over multi-step resist-based lithography and focused beam-induced deposition using gaseous precursors, such as its simplicity and speed, respectively. The optimized process leads to Pd-rich structures with low electrical resistivity values of 141 and 152 μΩ cm under Ne+ or He+ fluences of 1000 and 5000 μC cm−2, respectively. These resistivity values correlate well with compositional and microstructural studies, indicating a high Pd metallic content in a dense structure with a few-nm grain size. The obtained results are compared to similar structures fabricated by direct electron and gallium beam nanowriting, demonstrating the full potential of nanopatterned Pd-based organometallic thin films under the most common focused charged beams. The practical applications of combining spin-coated organometallic thin films with focused beam nanowriting in micro- and nano-lithography modern procedures are also discussed in this contribution.

Graphical abstract: Fabrication of palladium-enriched metallic structures by direct focused He+ and Ne+ beam nanowriting from organometallic thin films: a comparison with Ga+ and e− beams

Supplementary files

Article information

Article type
Paper
Submitted
28 Jun 2024
Accepted
13 Sep 2024
First published
28 Oct 2024
This article is Open Access
Creative Commons BY-NC license

Nanoscale, 2024,16, 21128-21137

Fabrication of palladium-enriched metallic structures by direct focused He+ and Ne+ beam nanowriting from organometallic thin films: a comparison with Ga+ and e beams

L. Herrer, A. Salvador-Porroche, G. Hlawacek, P. Cea and J. M. De Teresa, Nanoscale, 2024, 16, 21128 DOI: 10.1039/D4NR02680B

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