Issue 19, 2024

A wafer scale thin film of ultra-small Sc2O3 nanocrystals on a 2D COF with high rigidity

Abstract

Scandium oxide (Sc2O3) has a wide range of applications in metallurgy, chemical industry, electronics and many other high-tech fields. However, most Sc2O3 materials exist in the powder or bulk form, while nanostructured Sc2O3 has rarely been reported as there is a lack of a common method to control its dimensionality, hindering the understanding of new properties and potential applications of nano-Sc2O3 materials. In this paper, we establish a procedure to synthesize a two-dimensional (2D) Sc2O3–covalent organic framework (COF) composite film where the crystal size of Sc2O3 domains is as small as ∼3 nm. The composite film is prepared by a Schiff base condensation reaction at the sharp n-pentane/water interface using a combination of surfactant-monolayer-assisted interfacial synthesis and laminar assembly polymerization methods. Then the conditions of nucleation and uniform film formation of the 2D Sc2O3/COF are explored further. Meanwhile, an atomic force microscopy indentation test shows that the material has a high Young's modulus of 89.1 ± 3.8 GPa, which is much higher than those of the majority of reported 2D polymer materials. We further extended this synthesis method to the preparation of Yb2O3 (ytterbium oxide) and/or Er2O3 (erbium oxide)-incorporated 2D COF composite films, verifying the universality of this strategy. This work provides an opportunity to vary the dimensionality of many kinds of metal oxides and explore the potential applications of low-dimensional Sc2O3 materials.

Graphical abstract: A wafer scale thin film of ultra-small Sc2O3 nanocrystals on a 2D COF with high rigidity

Supplementary files

Article information

Article type
Paper
Submitted
22 Dec 2023
Accepted
12 Apr 2024
First published
15 Apr 2024

Nanoscale, 2024,16, 9509-9515

A wafer scale thin film of ultra-small Sc2O3 nanocrystals on a 2D COF with high rigidity

X. Guan, X. Xu, Z. Yu, J. Xiong, Y. Chang, B. Liu and B. Wang, Nanoscale, 2024, 16, 9509 DOI: 10.1039/D3NR06552A

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