Issue 4, 2024

Assessment of matrix effects induced by chloride, sulfate and dissolved organic carbon during Si isotope measurements by MC-ICP-MS under wet plasma conditions

Abstract

Since 2006, with the development of an optimized methodology for silicon purification based on alkaline fusion followed by cation-exchange chromatography, silicon isotopes have been widely measured across diverse sample types. Nevertheless, this technique does not remove anions and dissolved organic carbon (DOC), leading to potential matrix effects. Notably, under dry plasma conditions, several studies have reported offset in the δ30Si value up to +1.4‰ when [S]/[Si] > 0.02 (wt/wt) and +0.65‰ when [DOC]/[Si] > 1.75. Here, we examine the matrix effects induced by chloride, sulfate and dissolved organic carbon under wet plasma conditions. To achieve this, we doped the NBS-28 (NIST® RM 8546) solution, with varying amounts of sulfate and chloride and measured the δ30Si value in the doped solutions. To investigate the DOC matrix effect, we used the UV photolysis method to decompose the DOC within natural samples and then compared the resulting δ30Si values with those of untreated samples. Importantly, we did not observe any significant δ30Si offset outside the range of our long-term analytical precision (±0.11‰, 2SD) attributed to chloride, sulfate, or DOC across a range of [Cl]/[Si] = 0.09 to 5.65, [SO42−]/[Si] = 0.09 to 5.65 and [DOC]/[Si] = 0.08 to 6.38. Even though no offset in δ30Si value is observed for DOC-contaminated samples, we recommend removal of DOC. We suggest that the matrix effect observed under dry plasma conditions can be primarily attributed to the use of introduction systems with desolvating membranes, followed by differences in the operating parameters and the absolute quantity of anions introduced into the plasma. Our study indicates that precise and accurate measurements (<0.11‰, 2SD) can be reached for stable Si isotope ratios by MC-ICP-MS in wet plasma, with a larger tolerance to sample based-matrix effect induced by anion contamination compared to dry plasma.

Graphical abstract: Assessment of matrix effects induced by chloride, sulfate and dissolved organic carbon during Si isotope measurements by MC-ICP-MS under wet plasma conditions

Supplementary files

Article information

Article type
Technical Note
Submitted
25 Aug 2023
Accepted
19 Feb 2024
First published
26 Feb 2024
This article is Open Access
Creative Commons BY-NC license

J. Anal. At. Spectrom., 2024,39, 1033-1042

Assessment of matrix effects induced by chloride, sulfate and dissolved organic carbon during Si isotope measurements by MC-ICP-MS under wet plasma conditions

S. López-Urzúa, T. Luu and L. Derry, J. Anal. At. Spectrom., 2024, 39, 1033 DOI: 10.1039/D3JA00290J

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