Issue 3, 2024

Towards 26% efficiency in inverted perovskite solar cells via interfacial flipped band bending and suppressed deep-level traps

Abstract

The strong nonradiative recombination loss of inverted PSCs at the surface and at the perovskite/C60 interface has limited the open-circuit voltage (Voc) and fill factor (FF) of the device and prevented further performance enhancement of PSCs. Here, a new phenomenon was introduced: piperazinium diiodide (PDI) as a surface modifier to suppress deep-level defects at the surface and regulate band alignment at the interface. Instead of penetrating into the lattice and forming a 2D structure, PDI existed mainly in a molecular form thermodynamically prone to deprotonation to prevent the deprotonation reaction between A-site cations and the formation of deep-level defects on the surface. In addition, PDI was shown to partially penetrate into C60 to modulate interfacial band bending to facilitate electron transport and hinder hole backflow. Accordingly, a more homogeneous surface contact potential difference (CPD) and a higher extraction rate of the hot carriers at the interface were observed in the PDI-treated films. Finally, the optimized inverted devices exhibited a state-of-art power conversion efficiency (PCE) of 26.15%, with a certified PCE of 25.87% (quasi-steady-state: 25.52%). Voc increased from 1.12 V to 1.18 V, benefiting from a 57 mV higher quasi-Fermi level splitting (QFLS). Notably, the devices retained 90.4% and 94.2% of the initial efficiency after being aged at 85 °C for >500 h and tracked at the maximum power point for 1000 h, respectively.

Graphical abstract: Towards 26% efficiency in inverted perovskite solar cells via interfacial flipped band bending and suppressed deep-level traps

Supplementary files

Article information

Article type
Paper
Submitted
12 Oct 2023
Accepted
18 Dec 2023
First published
20 Dec 2023

Energy Environ. Sci., 2024,17, 1153-1162

Towards 26% efficiency in inverted perovskite solar cells via interfacial flipped band bending and suppressed deep-level traps

Y. Zheng, Y. Li, R. Zhuang, X. Wu, C. Tian, A. Sun, C. Chen, Y. Guo, Y. Hua, K. Meng, K. Wu and C. Chen, Energy Environ. Sci., 2024, 17, 1153 DOI: 10.1039/D3EE03435F

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