Issue 10, 2024

Application of transition-edge sensors for micro-X-ray fluorescence measurements and micro-X-ray absorption near edge structure spectroscopy: a case study of uranium speciation in biotite obtained from a uranium mine

Abstract

In this study, we successfully applied a transition-edge sensor (TES) spectrometer as a detector for microbeam X-ray measurements from a synchrotron X-ray light source in the hard X-ray region to determine uranium (U) distribution at the micro-scale and its chemical species in biotite obtained from a U mine. It is difficult to separate the fluorescent X-ray of the U Lα1 line at 13.615 keV from that of the Rb Kα line at 13.395 keV in the X-ray fluorescence spectrum with an energy resolution of approximately 220 eV using a conventional silicon drift detector (SDD). Meanwhile, the fluorescent X-rays of U Lα1 and Rb Kα were fully separated by a TES with 50 eV energy resolution at an energy of around 13 keV. The successful peak separation by the TES led to an accurate mapping analysis of trace U in micro-X-ray fluorescence measurements and a decrease in the signal-to-background ratio in micro-X-ray absorption near edge structure spectroscopy. Thus, it could be a powerful tool for studying the U distribution and speciation in various environmental samples.

Graphical abstract: Application of transition-edge sensors for micro-X-ray fluorescence measurements and micro-X-ray absorption near edge structure spectroscopy: a case study of uranium speciation in biotite obtained from a uranium mine

Supplementary files

Article information

Article type
Paper
Submitted
12 Jan 2024
Accepted
10 Mar 2024
First published
11 Mar 2024

Analyst, 2024,149, 2932-2941

Application of transition-edge sensors for micro-X-ray fluorescence measurements and micro-X-ray absorption near edge structure spectroscopy: a case study of uranium speciation in biotite obtained from a uranium mine

T. Yomogida, T. Hashimoto, T. Okumura, S. Yamada, H. Tatsuno, H. Noda, R. Hayakawa, S. Okada, S. Takatori, T. Isobe, T. Hiraki, T. Sato, Y. Toyama, Y. Ichinohe, O. Sekizawa, K. Nitta, Y. Kurihara, S. Fukushima, T. Uruga, Y. Kitatsuji and Y. Takahashi, Analyst, 2024, 149, 2932 DOI: 10.1039/D4AN00059E

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