Machine learning of atomic force microscopy images of organic solar cells

Abstract

The bulk heterojunction structures of organic photovoltaics (OPVs) have been overlooked in their machine learning (ML) approach despite their presumably significant impact on power conversion efficiency (PCE). In this study, we examined the use of atomic force microscopy (AFM) images to construct an ML model for predicting the PCE of polymer : non-fullerene molecular acceptor OPVs. We manually collected experimentally observed AFM images from the literature, applied data curing and performed image analyses (fast Fourier transform, FFT; gray-level co-occurrence matrix, GLCM; histogram analysis, HA) and ML linear regression. The accuracy of the model did not considerably improve even by including AFM data in addition to the chemical structure fingerprints, material properties and process parameters. However, we found that a specific spatial wavelength of FFT (40–65 nm) significantly affects PCE. The GLCM and HA methods, such as homogeneity, correlation and skewness expand the scope of image analysis and artificial intelligence in materials science research fields.