Issue 45, 2023

Surface band bending caused by native oxides on solution-processed twinned InSb nanowires with p-type conductivity

Abstract

Indium antimonide nanowires (InSb NWs) are attractive building-block candidates for bottom-up construction of high-efficiency electronics and optoelectronics due to their narrow direct band gap, fast room temperature carrier mobilities and small exciton binding energy. However, InSb NWs synthesized by the vapor–liquid–solution (VLS) mechanism generally suffer from an increased carrier and phonon scattering rate, which is thought to be caused by randomly distributed crystal defects along the NW growth direction. In this study, by utilizing the recently developed low-temperature, solution-processed technique, these crystal defects were successfully suppressed by periodically distributed twin planes to form twinned InSb nanowires. Importantly, measurements of the electrical transport properties of field effect transistors (FETs) reveal that the InSb NWs exhibit a hole-dominated conductivity with room temperature mobilities of up to 50.71 cm2 V−1 s−1, which is distinctly contrary to the intrinsic n-type InSb NWs. This observation of n–p switching behavior is probably attributed to the surface band bending effect with regard to the Fermi energy level, which is caused by surface oxide trap states arising from the native-oxide layer at the surface of the InSb NWs. All these results illustrate that the as-prepared colloidal InSb NWs can potentially be used as p-type materials for integration with next-generation nanoscale electronics and optoelectronics via surface engineering.

Graphical abstract: Surface band bending caused by native oxides on solution-processed twinned InSb nanowires with p-type conductivity

Supplementary files

Article information

Article type
Paper
Submitted
06 Aug 2023
Accepted
27 Oct 2023
First published
27 Oct 2023

Nanoscale, 2023,15, 18473-18480

Surface band bending caused by native oxides on solution-processed twinned InSb nanowires with p-type conductivity

R. Xu, K. Xu, Y. Sun, Y. Wen, L. Cheng, F. Shen and Y. Qian, Nanoscale, 2023, 15, 18473 DOI: 10.1039/D3NR03924B

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