Issue 36, 2023

An unexpected interfacial Mo-rich phase in 2D molybdenum disulfide and 3D gold heterojunctions

Abstract

The interface engineering of two-dimensional transition metal dichalcogenides (2D-TMDs) and metals has been regarded as a promising strategy to modulate their outstanding electrical and optoelectronic properties. Chemical Vapour Deposition (CVD) is an effective strategy to regulate the contact interface between TMDs and metals via directly growing 2D TMDs on a 3D metal substrate. Nevertheless, the underlying mechanisms of interfacial phase formation and evolution during TMD growth on a metallic substrate are less known. In this work, we found a 2D non-van der Waals (vdW) Mo-rich phase (MoNSN+1) during thermal sulfidation of a Mo–Au surface alloy to molybdenum disulfide (MoS2) in a S-poor environment. Systematic atomic-scale observations reveal that the periodic Mo and S atomic layers are arranged separating from each other in the non-vdW Mo-rich phase, and the Mo-rich phase preferentially nucleates between outmost 2D MoS2 and a 3D nanostructured Au substrate which possesses copious surface steps and kinks. Theoretical calculations demonstrate that the appearance of the Mo-rich phase with a unique metallic nature causes an n-type contact interface with an ultralow transition energy barrier height. This study may help understand the formation mechanism of the interfacial second phase during the epitaxial growth of 2D-TMDs on 3D nanostructured metals, and provide a new approach to tune the Schottky barrier height by the design of the interfacial phase structure at the heterojunction.

Graphical abstract: An unexpected interfacial Mo-rich phase in 2D molybdenum disulfide and 3D gold heterojunctions

Supplementary files

Article information

Article type
Paper
Submitted
19 Apr 2023
Accepted
15 Aug 2023
First published
21 Aug 2023

Nanoscale, 2023,15, 14906-14911

An unexpected interfacial Mo-rich phase in 2D molybdenum disulfide and 3D gold heterojunctions

M. Wang, R. Luo, Y. Liu, X. Zhao, X. Zhuang, W. W. Xu, M. Chen and P. Liu, Nanoscale, 2023, 15, 14906 DOI: 10.1039/D3NR01818K

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