Precise graphene cutting using a catalyst at a probe tip under an electron beam

Abstract

The method of precise cutting of 2D materials by simultaneous action of a catalyst at the tip of the scanning microscope probe and an electron beam in a high-resolution transmission electron microscope is proposed and studied using atomistic simulations by the example of graphene and a nickel catalyst. Reactive molecular dynamics simulations within the Compu-TEM approach for the description of electron impact effects show that the combination of the nickel catalyst and electron irradiation is crucial for graphene cutting. Cuts with straight edges with widths of about 1–1.5 nm can be obtained. The detailed atomistic mechanism of graphene cutting is investigated via the analysis of statistics on atom ejection and bond reorganization reactions induced by the irradiation. The principal and secondary channels of atom ejection which lead to propagation of the cut are shown to be ejection of two-coordinated atoms at the cut edges bonded to the nickel tip and three-coordinated atoms from the defective graphene structure near the tip. At the same time, the ejection of two-coordinated atoms not bonded to the tip and atoms in chains at the cut edges favors smoothing of free cut edges behind the tip. A considerable difference from the atomistic mechanism of cutting a carbon nanotube via the simultaneous action of electron irradiation and nickel catalyst is discussed. The ab initio calculations performed show a decrease of the binding energy of two-coordinated carbon atoms bonded to the nickel cluster in comparison with the same cut edge in the absence of the cluster confirming that the principal channel of atom ejection is related to the cut propagation.