Investigating the local structure of Ti based MXene materials by temperature dependent X-ray absorption spectroscopy

Abstract

The local structures of Ti based MXene-type electrode materials have been studied by Ti K-edge X-ray absorption fine structure measurements as a function of temperature to obtain direct information on the local bond lengths and their stiffness. In particular, the parent MAX phases Ti₂AlC and Ti₃AlC₂ and their etched MXene systems are characterized and their properties compared. We find that selective etching has a substantial effect on the local structural properties of the Ti based MXene materials. It leads to an increase in the interatomic distances, i.e. a decrease in the covalency, and corresponding bond stiffness, that is a likely cause of higher achievable performances. The obtained results underline the importance of the local atomic correlations as limiting factors in the diffusion capacity of ion batteries.