Lock-in amplifier based peak force infrared microscopy

Abstract

Nanoscale infrared (nano-IR) microscopy enables label-free chemical imaging with a spatial resolution below Abbe's diffraction limit through the integration of atomic force microscopy and infrared radiation. Peak force infrared (PFIR) microscopy is one of the emerging nano-IR methods that provides non-destructive multimodal chemical and mechanical characterization capabilities using a straightforward photothermal signal generation mechanism. PFIR microscopy has been demonstrated to work for a wide range of heterogeneous samples, and it even allows operation in the fluid phase. However, the current PFIR microscope requires customized hardware configuration and software programming for real-time signal acquisition and processing, which creates a high barrier to PFIR implementation. In this communication, we describe a type of lock-in amplifier-based PFIR microscopy that can be assembled with generic, commercially available equipment without special hardware or software programming. We demonstrate this method on soft matters of structured polymer blends and blocks, as well as biological cells of E. coli. The lock-in amplifier-based PFIR reduces the entry barrier for PFIR microscopy and makes it a competitive nano-IR method for new users.